Brigates Makes Its VISION Stuttgart Debut with Advanced Imaging Solutions

STUTTGART, Germany — Brigates, a developer of CMOS image sensors and digital imaging solutions, is making its debut at VISION Stuttgart trade fair for machine vision. Following positive market feedback at CIOE in Shenzhen, the company is presenting new products based on its proprietary ECCD-TDI technology, with precision imaging solutions for semiconductor manufacturing, X-ray non-destructive testing (NDT), power battery inspection, and medical imaging.

The LCG series of DUV ECCD-TDI cameras is designed for precision optical inspection in front-end semiconductor manufacturing. The series addresses the demands of bright-field and dark-field inspection in advanced semiconductor processes, combining high inspection speeds, a wide dynamic range, and stable performance under DUV exposure. It offers a maximum line rate of 4 MHz and a maximum dynamic range exceeding 80 dB, together with low noise and resistance to DUV radiation. Available in 2K and 4K resolutions and feature a 200G CoF high-speed interface.
The LCP-HS series of DUV ECCD-TDI cameras is designed for ultra-precision defect inspection in advanced semiconductor manufacturing. By combining high resolution with high-speed data transmission, the highspeed accurate detection of small defects. Features 5 ?m pixels, 8K and 16K resolution options, read noise as low as 4 e?, and a maximum single-array HDR dynamic range exceeding 72 dB. The series offers 200G and 400G CoF high-bandwidth interfaces to support demanding semiconductor inspection applications.

For NDT applications, the iEX series of X-ray TDI line-scan detectors is tailored for high-speed inline inspection of power batteries and industrial flaw detection. Its ECCD-TDI charge-accumulation technology improves the signal-to-noise ratio, mitigates image blur and lower the risk of missed defects during high-speed operation. With a maximum line rate of 40 kHz, the series delivers clear, stable imaging on production lines.
The supX1512S X-ray CMOS flat-panel detector is designed for medical imaging, industrial NDT, and semiconductor inspection. It addresses requirements for high imaging resolution, fast frame rates, and a long operating life under demanding conditions. Featuring 48 ?m pixels, the detector supports full-resolution imaging at up to 60 fps and radiation tolerance of up to 20,000 Gy. It also offers high detective quantum efficiency (DQE) and modulation transfer function (MTF) performance.

“Our debut at VISION Stuttgart marks an important step in our international expansion,” said a Brigates representative. “Alongside our product portfolio, we offer customized imaging development services. We look forward to working with European equipment manufacturers and system integrators to address complex precision imaging challenges.”
For more product information, visit www.brigates.com.